Solar Cell TF AOI

Solar Cell TF AOI

Description

The Solar Cell TF AOI sets a new standard in crack detection technology, offering a comprehensive solution for both solar wafers and solar cells. With its advanced features, this system enhances the efficiency and reliability of the inspection process in solar cell and wafer manufacturing.

Features

• In-Line Crack Detection for Solar Wafer and Solar Cells Inspection System:
  Implement robust in-line crack detection capabilities for both solar wafers and solar cells. The Solar Cell TF AOI system ensures the early identification of cracks, contributing to the overall integrity and reliability of the solar components.
• Superior Technique for Non Visible Crack Inspection for Complete or In-Process Cells:
  Employ an advanced technique for non-visible crack inspection, ensuring comprehensive examination of complete or in-process solar cells. This capability is crucial for detecting subtle cracks that may not be immediately visible, enhancing the overall quality assurance process.
• Non-Contact, High-Speed Line-Scan Technology:
  Utilize state-of-the-art non-contact, high-speed line-scan technology for efficient and accurate inspection. The Solar Cell TF AOI machine employs non-intrusive methods, ensuring minimal impact on the manufacturing process while maintaining high-speed operation.
• Outstanding Image Quality, Reliability Assurance:
  Experience exceptional image quality with a focus on reliability assurance. The Solar Cell TF AOI system provides clear and precise images, ensuring reliable inspection results and contributing to the overall quality and durability of the solar cells.